High-precision measurement of free spectral range of etalon
نویسندگان
چکیده
منابع مشابه
Air etalon facilitated simultaneous measurement of group refractive index and thickness using spectral interferometry.
A simple method based on air etalons of a transparent cavity is proposed to simultaneously measure the group refractive index and thickness of a transparent optical plate by spectral domain low coherence interferometry. In this method, only a single beam path is needed in contrast to the two beam paths, the reference and sample arms, of the conventional Michelson interferometer. An empty cavity...
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ژورنال
عنوان ژورنال: Electronics Letters
سال: 2006
ISSN: 0013-5194
DOI: 10.1049/el:20060652